Major publications

1. F.Shiota, Y.Miki, A.Namba, Y.Nezu, Y.Sakamoto, T.Morokuma,and Ko Hara: IEEE Trans. Instrum.Meas. 44-2, 583-586 (1995)
2. K.Kuroda and N.Mio: Test of a Composition-Dependent Force by a Free-Fall Interferometer, Phys.Rev.Lett. 62-17, 1941-1944(1989).
3. M.Tanaka and K.Nakayama: A New Angular Shearing Interferometer for Collimation in the Nanoradian Range, Jpn.J.Appl.Phys.,1990, 29,427-433.
4. K.Nakayama, H.Fujimoto, M.Tanaka, and K.Kuroda:, Silicon lattice measurement with an improved X-ray/optical interferometer, IEEE Trans. Instrum.& Meas. 42-2, 401-404 (1993).
5. H.Fujimoto, M.Tanaka and K.Nakayama:Noise Reduction in an Optical Interferometer for Picometer Measurements, IEEE Trans. Instrum.& Meas. 44-2, April, 470-474 (1995).
6. H.Fujimoto, K.Nakayama, M.Tanaka, and G.Misawa: Absolute Measurement of lattice spacing d(220)in Floating zone Silicon crystal, Jpn.J.Appl.Phys., Vol.34,No.9A, pp5065-5069 (1995).
7. H.Yamada,T.Fujii,and K.Nakayama: Experimental study of forces Between a tunnel tip and graphite surface. J.Vac.Sci.Technol.A6, 293, Mar/Apr(1988).
8. H.Yamada, T.Fujii, and K.Nakayama: Linewidth Measurement by a New Scanning Tunneling Microscope, Japan,J.Appl.Phys.28(11)2402(1989).
9. Masami Kageshima, Hirofumi Yamada, Yukinori Morita, Hiroshi Tokumoto, Kan Nakayama and Akira Kawazu: Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy, Jpn.J. Appl.Phys.,32, L1321-L1323, (1993).
10. G.Misawa, H.Yamada, Y.Seino and K.Nakayama, Atomic force microscopy of cracks and corrugations induced by Vicker's indenter on Si(110) and GaAs(100).Jpn.J. Appl.Phys.,35, pp3778-3782 (1996).
11. K.Nakayama, M.Tanaka, F.Shiota and K.Kuroda, Precision Physical Measurements and Nanometrology, Metrologia, 28, 483-502 (1991/1992) (review).

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