National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
E-mail to webmaster (Japanese) E-mail to webmaster (English)
Nano-metrology Section

Nano-metrology Section

Last modified 1996/10/30

Scope of Activity

Precision interferometry of X-ray, laser radiation, magnetic flux, superconducting electrons are applied to high precision measurement including determination of the fundamental constants. Nanometrology and Picometrology are also developed with experimental analysis on ultimate noise, smallest signal and quantum mechanical effects.

List of Future Possible Research Themes
Replacing kilogram by superconducting magnetic levitation
X-ray and optical interferometry in sub-pm region
Precision x-ray goniometry in nanoradian range
Development of silicon metrology( monolithic x-ray interferometer
silicon lattice scale for x-ray spectroscopy and x-ray diffractometry)
Upgrading of scanning probe microscopy
Study of mechanics in nanometer space
Development of SPM for nanometer metrology

Research Themes

  1. Absolute measurement of silicon lattice spacing

  2. Absolute measurement of magnetic flux quanta using superconducting magnetic leitation

  3. Atomic force microscopy of micro-indentation

  4. Research on the Scanning Probe Microscopy

International collaboration

Staff

Major publication

Contact: Nano-metrology Section
E-mail:nakayama@nrlm.go.jp
Tel:+81-XXX-XX-4152, Fax:+81-298-50-1456