National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
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Optical Measurement Section, NRLM, AIST

Interferometry for Length Measurement with Wavelength Standards

  1. Development of an interferometer for absolute length measurement
    A high resolution / wide dynamic range interferometer with wavelength standard will be developed for absolute length measurement. As the first step, a new equipment for line standard is being prepared, while a frequency scanning interferometer is being developed.
  2. Improvement of refractive index correction
    Two color interferometer is being developed in order to improve refractive index correction, which is the most dominant error factor for interferometric length measurement.
  3. Reliability improvement of interferometric measurement
    Light source for length standard will be developed, which incorporates a simple interferometer with molecular absorption line or a grating etalon.